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E-mail : jhjin@jnoptic.com / Tel : 82-2-3473-4188
STM6 X-Y data cable
26OCM10/100
30.5S-G533
A 40 PL
AA1276 (SOLD OUT)
ADOBE PHOTOSHOP ELEMENTS 2.0
AL-1824
U-TV0.5X (SOLD OUT)
DP70-IFAD
FLM6
FV5-COL
FV5-FUR
IX-DP10
IX-DP40
IX-DPA20
IX2-ARCEVA
IX2-DIC10
IX2-DIC40
IX2-DIC60
IX2-RFAL (SOLD OUT)
IX2-SHA-1-5
IX-SCL
IX-SUSP
LG-DI
LN22-P-13N1B
MM6-RHS250-2 (SOLD OUT)
PCDA40XPL-6
PL20
QUICKCAM FAST
RX-XYST
SZ2-LGSI
SZH-CLJ
SZX-APT (SOLD OUT)
SZX-AS (SOLD OUT)
SZX-STAD1 (SOLD OUT)
SZX-STL (SOLD OUT)
U-ACAD4515-1-5
U-APT (Without Power cord)_(SOLD OUT)
U-DO3 (SOLD OUT)
U-HSTR2
U-OSM
WI-FSH
XL-CAP
PLAPO60XWLSM (SOLD OUT)
LMPLFL100X
LCPLAPO50X
Profile of Jin Jae-Hwan ( Instructor )
CEO of JNOpTIC co., ltd
June 25, 2021
Patent registration:
Observation method and observation device
Simultaneous observation
( Bright Field and Fluorescence microscopy)
March 09, 2021
Patent registration:
sample fixing device and method of placing sample
Patent applied to section observation microscope
(JNO-FM-BX53-SET)
June 12, 2014
Patent registration:
Method of measuring the height of a sample using a microscope
June 5th ~ June 15th, 2000 ( OLYMPUS Japan in Tokyo)
Basic Knowledge of Microscope and Repair Training Course
September 4, 2003 ( OLYMPUS Japan in Tokyo)
Measuring Microscope Calibration License
Main Model: STM6
License ID Number: M029
September 4, 2003 ( OLYMPUS Japan in Tokyo)
Biological Confocal Microscope Setup & Service Training
Main Model: FluoView300 & FluoView500
October 3, 2003 ( OLYMPUS Japan in Tokyo)
Inverted Microscope & Research Stereo Microscope Service Training
Main Model: IX71 / SZX9
August 17th ~ August 20th, 2004 ( OLYMPUS Japan in Tokyo)
Confocal Microscope Setup & Service Training
Main Model: FV1000
October 11 ~ October 13, 2004 ( OLYMPUS Japan in Tokyo)
Confocal Microscope Setup & Service Training
Main Model: FV1000 M-COMB(Multi Combiner)
June 20, 2005 ~ June 23, 2005 ( OLYMPUS Japan in Tokyo)
Research System Microscope Service Training
Main Model: AX70
August 1st-August 2nd, 2005 ( OLYMPUS Japan in Tokyo)
Polarizing Microscope Instruction Training
Main Model: BX51P
December 19, 2005 ( OLYMPUS Japan in Tokyo)
ZDC Training for Maintenance & Basic Knowledge of Confocal Microscope
December 20 ~ 22, 2005 ( OLYMPUS Japan in Tokyo)
Brushup Course to bring out the power of a microscope (GA Academy)
August 2nd ~ August 4th, 2006 ( OLYMPUS Japan in Tokyo)
Confocal Laser Scanning Microscope for Industrial Market
D class License(for ols3000)
Main Model: OLS 3000(Lext)
October 11 ~ October 15, 2006 ( OLYMPUS Japan in Tokyo)
Confocal Laser Scanning Microscope Training for Bio Maket
Maintenance Service Training
Main Mode : M-COMB(Multi Combiner for FV1000)
December 9, 2006
IX Repair training
May 07 ~ May 11, 2007 ( OLYMPUS Japan in Tokyo)
Modify Training for Zero-Drift Compensation Unit of IX81
IX2-Cusominsing Training (Optic Port Modify)
Main Model: IX71 & IX81-ZDC
September 3rd ~ September 08th, 2007 ( OLYMPUS Japan in Tokyo)
Leicense D class Trainging
Main Model: OLYMPUS Bio Confocal Microscope FV1000
April 08 ~ April 10, 2008 ( OLYMPUS Japan in INA_Nagano )
IV100 Setup Training
(in vivo fluorescence molecular imaging systems)
July 22 ~ July 23, 2008 ( Narishige Group in Tokyo, Japan )
Narishige Maintenance Training
July 24th ~ July 28th, 2008 ( OLYMPUS Japan in Tokyo)
Research Inverted Microscope maintenance Training
Main Model: IX81
May 18 ~ May 22, 2009 ( OLYMPUS Japan in Tokyo)
OLYMPUS Bio Confocal Microscope License Training
License Grade: FV1000 C class
June 23 ~ June 26, 2009 ( OLYMPUS Japan in Tokyo)
Confocal Laser Scanning Microscope License Training
License Grade: FV10i C class
October 19 ~ October 23, 2009 ( OLYMPUS Japan in Tokyo )
Multi Photon Laser Scanning MICROSCOPE Setup Training
Main Model: MPE C class
August 3rd ~ August 8th, 2010 ( OLYMPUS Japan in Tokyo )
Modify Training for Zero-Drift Compensation Unit of IX81
Main Model: IX81-ZDC2
JNO-DPTS (Down load Catalog JNO-DPTS)
The Unit to observe fluorescence image and IR DIC image at the same time with Multi-Dual Port tube of BX51-WI
(Made by JNOpTIC co.,ltd )
2-1. One Way((IR-DIC 775nm)
2-2. One Way((Visible Spectrum)
Simultaneously observation
– CA3 pyramidal neuron, IR-DIC & Alexa Fluor 488 (50 uM)
Advance Realtime Monitor. Easy-to-Use, Image Enhancement, etc
ARM is image analysis software for JNOPTIC AcquCAM cameras. This S/W is interchangeable with all WDM cameras regardless of camera brand and model and even more the most strength point is simple and easy use of length, area, angle, etc.
Improvement Function about Microscopy Image Monochrome. (Used function: Auto Level)
Effective improvement of image with simple operation. This image is shot by JNOPTIC Pro/S3 camera
Improvement Function about Microscopy Image. (Used function: Auto Level)
Effective improvement of image with simple operation. These images are shot by JNOPTIC AcquCAM Pro/G3 camera
| Responding Model | Measurement value unit | Measurable height | Error of measuring 1000㎛ | Recommended measuring height |
| CX 41 | 0.2 ㎛ | -9.9 ~ 29.9㎜ | Below ±20㎛ | Below ± 2000㎛ |
| CKX 41 | 0.2 ㎛ | -9.9 ~ 29.9㎜ | Below ±20㎛ | Below ± 2000㎛ |
| BX – FM | 0.2 ㎛ | -9.9 ~ 29.9㎜ | Below ±20㎛ | Below ± 2000㎛ |
| BX 51/53 | 0.1 ㎛ | -9.9 ~ 29.9㎜ | Below ±10㎛ | Below ± 1000㎛ |
| MX 51 | 0.1 ㎛ | -9.9 ~ 29.9㎜ | Below ±10㎛ | Below ± 1000㎛ |
| MX 61L/61 | 0.1 ㎛ | -9.9 ~ 29.9㎜ | Below ±10㎛ | Below ± 1000㎛ |
JNOPTIC Image Analysis Software OpTIC Eye Series
기본측정+오토카운팅(입도분석용)+금속조직분석용
– 형상측정(상분율측정)
: 두가지 이상의 색상을 추출하여 면적율 계산
– 그레인사이즈(Grain Size Analysis)
: ASTM E 1382에 의한 금속표면의 결정립도 산출
: 교차점 / 면적 / 수동면적 추출방식
– 구상화율 분석(Nodular-graphite analysis)
: ASTM, ISO, JIS 규격에 따라 분석이 가능
– 비금속 개재물(Non-Metallic Inclusion)
: 산화물, 규산물, 황화물, 내화물, 광재등 추출
영상분석에 의한 구상화율 측정 (nodular-graphite analysis)
주철분석 소프트웨어 모듈로 ASTM, JIS, KS 규격에 따라 구상흑연주철의 구상흑연에 대하여 현미경영상분석을 통해 구상화율을 측정하고 결과를 표시합니다.
영상분석에 의한 결정도립 측정 (rain Size Analysis)
JNOPTIC Image Analysis Software OpTIC Eye Series
기본측정+보고서+오토카운팅(입도분석용)
– 셀이미지 자동측정(5단계 easy측정)
: 영상분할, 측정항목설정, 측정, 분류, 성적서기능
– 면적, 면적비, 반경, 직경등 15개 항목 자동측정
Auto Counting
영상을 자동 분석하는 기능입니다. 영상을 개체들(Objects)과 배경(Background)으로 분할(Segmentation)함 으로써 측정할 영역을 한번에 검출해내고, 면적 등을 자동측정 합니다. Auto Count는 위의 차례대로 측정이 이루어 집니다.
측정 항목 설정(Define Measure)
측정결과를 분석/분류 (Classification)
View Measurement를 통한 실시간 측정 항목 display 측정
크기별로 그룹화(Classification), 그룹별 색상화 가능
Report
측정결과를 4가지 형태의 Chart로 표시: Histogram, Line graph, Pie, Scatter-gram Excel 전송 가능
X Y Mover & Bridge Stage
| Description | |
| Material | Aluminum |
| 표면 처리 | Black –Anodizing |
| Travel Range (mm) | X ±12.5 Y ±12.5 |
| 높이 (mm) | 170 ~ 220 |
| Tap Hole 규격 | M6 |
| Tap Hole 간격 (mm) | X 25 Y 25 |
JNO-MHU is equipment to measure the height of sample, equipped with Z-axis stage handle. It could be equipped easily with new purchasing or existing microscope
< Consist of >
Responding Model |
Measurement value unit |
Recommended measuring height |
CX 41 |
0.2 ㎛ |
Below ± 2000㎛ |
CKX 41 |
0.2 ㎛ |
Below ± 2000㎛ |
BX – FM |
0.2 ㎛ |
Below ± 2000㎛ |
BX 51/53 |
0.1 ㎛ |
Below ± 1000㎛ |
MX 51 |
0.1 ㎛ |
Below ± 1000㎛ |
MX 61L/61 |
0.1 ㎛ |
Below ± 1000㎛ |
HOW TO MEASURE BY JNO-MHU
AcquCAM 23S
(Down load Catalog ACQUCAM 23S)
EXMOR Sensors: Next-generation imaging sensors based on CMOS, increase the strength and reduce noise.
High sensitivity camera available from visible to IR range
Available wider range of observation
These images were shot by AcquCAM 23S Package.
High sensitivity and fast frame image
[Specification]
| Spec | Description |
| Size | 1/1.2 inch |
| Resolution | H: 1920, V: 1200 |
| Pixel size | H: 5.86 µm, V: 5.86 µm |
| Video formats
& Frame rate |
1920×1200 Y16 @ 25 fps
1920×1200 Y800 @ 54 fps |
| Sensitivity | 0.015 lx |
| Exposure time | 1/100000 to 30 s |
| Lens mount | C/Cs mount |
| Interface | USB 3.0 |
| Power supply | 4.5 to 5.5 VDC |
| Dimensions | H: 29 mm, W: 29 mm, L: 43 mm |
| Mass | 65 g |
